检验项添加抽样类型绑定

zhuo

2025-05-08 30ca7a8dc82a7cfadadb37d8e9e6b8e68be06f27

 basic-server/src/main/resources/mapper/StructureItemParameterMapper.xml

@@ -3,11 +3,7 @@
        PUBLIC "-//mybatis.org//DTD Mapper 3.0//EN"
        "http://mybatis.org/dtd/mybatis-3-mapper.dtd">
<mapper namespace="com.ruoyi.basic.mapper.StructureItemParameterMapper">
    <delete id="removeNoSample">
        delete
        from structure_item_parameter
        where sample like concat('%', #{sample}, '%')
    </delete>

    <select id="selectItemParameterList" resultType="com.ruoyi.basic.pojo.StructureItemParameter">
        select * from (select A.id,
        inspection_item,
@@ -41,7 +37,8 @@
        code,
        radius_list,
        rates,
        device_ids
        device_ids,
        spot_check_type
        from (select *,
        CASE
        WHEN INSTR(sample, ',') > 0 THEN
@@ -109,6 +106,13 @@
        from structure_test_object sto
                 left join product p on p.object_id = sto.id
    </select>
    <select id="selectDeviceIdsByNumber" resultType="java.lang.Integer">
        select id from device
        where management_number in
        <foreach item="item" collection="managementNumberList" open="(" separator="),(" close=")">
            #{item}
        </foreach>
    </select>

    <resultMap id="itemDto" type="com.ruoyi.basic.dto.TestItemDto">
        <result column="sId" property="id"/>